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Proceedings Paper

Industrial applications of THz systems
Author(s): S. Wietzke; C. Jansen; C. Jördens; N. Krumbholz; N. Vieweg; M. Scheller; M. K. Shakfa; D. Romeike; T. Hochrein; M. Mikulics; M. Koch
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Paper Abstract

Terahertz time-domain spectroscopy (THz TDS) holds high potential as a non-destructive, non-contact testing tool. We have identified a plethora of emerging industrial applications such as quality control of industrial processes and products in the plastics industry. Polymers are transparent to THz waves while additives show a significantly higher permittivity. This dielectric contrast allows for detecting the additive concentration and the degree of dispersion. We present a first inline configuration of a THz TDS spectrometer for monitoring polymeric compounding processes. To evaluate plastic components, non-destructive testing is strongly recommended. For instance, THz imaging is capable of inspecting plastic weld joints or revealing the orientation of fiber reinforcements. Water strongly absorbs THz radiation. However, this sensitivity to water can be employed in order to investigate the moisture absorption in plastics and the water content in plants. Furthermore, applications in food technology are discussed. Moreover, security scanning applications are addressed in terms of identifying liquid explosives. We present the vision and first components of a handheld security scanner. In addition, a new approach for parameter extraction of THz TDS data is presented. All in all, we give an overview how industry can benefit from THz TDS completing the tool box of non-destructive evaluation.

Paper Details

Date Published: 5 August 2009
PDF: 13 pages
Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 738506 (5 August 2009); doi: 10.1117/12.840991
Show Author Affiliations
S. Wietzke, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
C. Jansen, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
C. Jördens, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
N. Krumbholz, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
N. Vieweg, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
M. Scheller, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
M. K. Shakfa, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
D. Romeike, Technische Univ. Braunschweig (Germany)
Joint Optical Metrology Ctr. (Germany)
T. Hochrein, Technische Univ. Braunschweig (Germany)
Süddeutsches Kunststoff-Zentrum (Germany)
M. Mikulics, Research Ctr. Jülich (Germany)
M. Koch, Philipps-Univ. Marburg (Germany)


Published in SPIE Proceedings Vol. 7385:
International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications
X.-C. Zhang; James M. Ryan; Cun-lin Zhang; Chuan-xiang Tang, Editor(s)

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