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Proceedings Paper

New development of large-area direct conversion detector for digital radiography using amorphous selenium with a C60-doped polymer layer
Author(s): F. Nariyuki; S. Imai; H. Watano; T. Nabeta; Y. Hosoi
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Paper Abstract

We have developed a novel direct conversion detector for digital radiography by using a fullerene (C60)-doped polymer layer added on a thick amorphous selenium (a-Se) layer coupled to an amorphous silicon thin-film transistor (a-Si TFT) array. This detector exhibits considerable improvement in the lag characteristics and durability in high ambient temperatures. The C60-doped polymer layer, which is directly and uniformly solution cast on the a-Se layer and followed by an inorganic electron-transporting layer, smoothly changes the electronic junction between the a-Se layer and the inorganic layer. It lubricates the emission of photocurrents from the a-Se photo-conversion layer and leads to the improved lag characteristics. Another merit of using a C60-doped polymer is that it is stabile in high-temperature ambient conditions and is not degraded by humidity or a large amount of X-ray exposure. The polymer layer prevents the crystallization of a-Se, which otherwise occurs on exposure of a-Se to high temperature not only during the deposition of the inorganic layer or the metal electrode layer in the manufacturing process but also in actual use. A prototype detector, with a size of 17 in × 17 in and a pixel pitch of 150 μm, exhibited a good resolution; its DQE is approximately 48% at 1 cy/mm in 258 μC/kg (RQA5). This new development can simplify cooling apparatus and detector modules and also make a wide range of operational environments available. In addition, the improved lag characteristics make it possible to reduce the exposure intervals for static imaging, tomosynthesis, and other various exposure techniques.

Paper Details

Date Published: 22 March 2010
PDF: 7 pages
Proc. SPIE 7622, Medical Imaging 2010: Physics of Medical Imaging, 762240 (22 March 2010); doi: 10.1117/12.840788
Show Author Affiliations
F. Nariyuki, FUJIFILM Corp. (Japan)
S. Imai, FUJIFILM Corp. (Japan)
H. Watano, FUJIFILM Corp. (Japan)
T. Nabeta, FUJIFILM Corp. (Japan)
Y. Hosoi, FUJIFILM Corp. (Japan)


Published in SPIE Proceedings Vol. 7622:
Medical Imaging 2010: Physics of Medical Imaging
Ehsan Samei; Norbert J. Pelc, Editor(s)

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