Share Email Print

Proceedings Paper

High sensitivity of SPR with microplasmonic structures
Author(s): Ludovic S. Live; Jean-Francois Masson
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The plasmonic nature of discontinuous thin films with micro-patterned structures such as triangles and hole arrays present distinct optical properties with a Kretschmann surface plasmon resonance (SPR) instrument. Au microstructures were prepared with a modified nanospheres lithography (NSL) method using 3.2 μm spheres which gives 1.8 μm triangles and hole arrays with hole diameter ranging from 2.5 to 0.5 μm. The sensitivity to refractive index in thin film is increased by up to 45% with using microhole arrays instead of continuous film. A transition in the microstructure aspect from triangles to hole arrays with large hole diameter affects the spectral aspect of the SPR active band. Triangles present a characteristic broad transmission maximum band while in hole arrays, a broad and weak absorption band first appears for large holes, which sharpens and increases in intensity as the hole diameter decreases. Moreover, the SPR penetration depth is tuned between 230 and 30 nm as the microstructure aspect shifts from continuous film, to small hole arrays and to isolated triangles. Thus, these new plasmonic properties were observed in microhole arrays excited in Kretschmann SPR configuration, which are spectrally similar to continuous film. These can significantly improve the existing SPR sensing methods.

Paper Details

Date Published: 12 February 2010
PDF: 6 pages
Proc. SPIE 7577, Plasmonics in Biology and Medicine VII, 757708 (12 February 2010); doi: 10.1117/12.840745
Show Author Affiliations
Ludovic S. Live, Univ. de Montréal (Canada)
Jean-Francois Masson, Univ. de Montréal (Canada)

Published in SPIE Proceedings Vol. 7577:
Plasmonics in Biology and Medicine VII
Tuan Vo-Dinh; Joseph R. Lakowicz, Editor(s)

© SPIE. Terms of Use
Back to Top