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Proceedings Paper

Reliability of high-power QCW arrays
Author(s): Ryan Feeler; Jeremy Junghans; Jennifer Remley; Don Schnurbusch; Ed Stephens
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Paper Abstract

Northrop Grumman Cutting Edge Optronics has developed a family of arrays for high-power QCW operation. These arrays are built using CTE-matched heat sinks and hard solder in order to maximize the reliability of the devices. A summary of a recent life test is presented in order to quantify the reliability of QCW arrays and associated laser gain modules. A statistical analysis of the raw lifetime data is presented in order to quantify the data in such a way that is useful for laser system designers. The life tests demonstrate the high level of reliability of these arrays in a number of operating regimes. For single-bar arrays, a MTTF of 19.8 billion shots is predicted. For four-bar samples, a MTTF of 14.6 billion shots is predicted. In addition, data representing a large pump source is analyzed and shown to have an expected lifetime of 13.5 billion shots. This corresponds to an expected operational lifetime of greater than ten thousand hours at repetition rates less than 370 Hz.

Paper Details

Date Published: 17 February 2010
PDF: 7 pages
Proc. SPIE 7583, High-Power Diode Laser Technology and Applications VIII, 758304 (17 February 2010); doi: 10.1117/12.840730
Show Author Affiliations
Ryan Feeler, Northrop Grumman Cutting Edge Optronics (United States)
Jeremy Junghans, Northrop Grumman Cutting Edge Optronics (United States)
Jennifer Remley, Northrop Grumman Cutting Edge Optronics (United States)
Don Schnurbusch, Northrop Grumman Cutting Edge Optronics (United States)
Ed Stephens, Northrop Grumman Cutting Edge Optronics (United States)


Published in SPIE Proceedings Vol. 7583:
High-Power Diode Laser Technology and Applications VIII
Mark S. Zediker, Editor(s)

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