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Proceedings Paper

Development and application of wedge-shaped probes in an ultrafast measurement system
Author(s): Tian Lan; Siying Chen; Cuiling Li; Guoqiang Ni
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Paper Abstract

A wedge-shaped probe is developed and applied for the detection of transient electrical signals in an ultrafast scanning tunneling microscope measurement system. The probe is composed of a low- temperature grown GaAs photoconductive switch and a metal tip with a diameter of 5 micrometers. The designed probe functions as a sampler of transient signals generated by a sample of coplanar strip photoconductive switch with ultrafast optical pulses of 100 fs in the ultrafast measurement system. The shape of the probe makes the approach of the probe to the sample in a way that is much easier than the traditional rectangular one. The metal tip is attached to the coplanar strip transmission line integrated in the photoconductive switch. The design of the probe is presented and its performances have been reported in this paper. Photo of the wedge-shaped probe is given and transient signals in picoseconds were observed in contact mode with the developed wedge-shaped probe.

Paper Details

Date Published: 24 November 2009
PDF: 9 pages
Proc. SPIE 7509, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 75090J (24 November 2009); doi: 10.1117/12.840144
Show Author Affiliations
Tian Lan, Beijing Institute of Technology (China)
Siying Chen, Beijing Institute of Technology (China)
Cuiling Li, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7509:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration
Xuping Zhang; Wojtek J. Bock; Xuejun Lu; Hai Ming, Editor(s)

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