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Proceedings Paper

The effects of water quality on the measurement results of nanoparticles' effective diameter and polydispersity by Photon Correlation Spectroscopy
Author(s): Jun Xiang; Peng Han
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Paper Abstract

The impurities in solution affect the measurement results of effective diameter and polydispersity of nanoparticles by Photon Correlation Spectroscopy. The purification of solution should be taken adequate concern to reflect the real characteristics of measured nanoparticles. The impurities in ultrapure water of three manufacturers were observed by differential interference microscope, Nikon Eclipse ME600. Based on the micrographs results, one of the equipments was chosen to manufacture water, and the water was purified into three different purification stages. The micrographs and background scattering light intensity of the three kinds of water were analyzed, and then the three kinds of water were used to measure standard particle nominated 90nm, and the measurement angle was from 50° to 130°. The measurement results indicate that water with high quality being used to measure nanoparticles can get stronger scattering intensity and lower value of polydispersity, and it is suitable for measurement with high precision. Impurities in water would weaken the light intensity scattered by measured nanoparticles and affect the measurement results of effective diameter and polydispersity. When laser power was relative lower, the effective diameter increased as angle. So the impurities in solution and the laser power should be paid special attention. Suggestions about choosing different stages of water purification for measurement with different precision are also given, when the equipment of water purification is determined. The effects of floc in ultrapure water on the measurement of nanoparticles still need study in future.

Paper Details

Date Published: 20 November 2009
PDF: 8 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110A (20 November 2009); doi: 10.1117/12.840121
Show Author Affiliations
Jun Xiang, South China Normal Univ. (China)
Peng Han, South China Normal Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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