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Proceedings Paper

Measuring errors for huge semi-regular meshes
Author(s): Arnaud Roquel; Anis Meftah; Frédéric Payan; Marc Antonini
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Paper Abstract

The softwares Mesh and Metro are widely used for measuring geometrical differences between two surfaces. Unfortunately, those two softwares cannot be used to compute the surface-to-surface distance for huge semiregular meshes because of the memory capacity. Consequently, estimating the quality of remeshing or geometry compression algorithms cannot be done for such data. To overcome this problem, we propose an original algorithm for computing the surface-to-surface distance even for huge semi-regular meshes. The method consists in exploiting the relevant multi-level structure of a semi-regular mesh for loading successively small regions of it and computing the symmetrical distance between them and the irregular mesh. Experimentally, the results obtained with the proposed method are similar to the results obtained with the software MESH, while using a small memory size. This latter can reach only 2% of the size of the semi-regular mesh. Then, we show that our approach allows to compute the surface-to-surface distance for huge semi-regular meshes.

Paper Details

Date Published: 4 February 2010
PDF: 10 pages
Proc. SPIE 7526, Three-Dimensional Image Processing (3DIP) and Applications, 75260T (4 February 2010); doi: 10.1117/12.839869
Show Author Affiliations
Arnaud Roquel, I3S Lab., CNRS, Univ. of Nice-Sophia Antipolis (France)
Anis Meftah, I3S Lab., CNRS, Univ. of Nice-Sophia Antipolis (France)
Frédéric Payan, I3S Lab., CNRS, Univ. of Nice-Sophia Antipolis (France)
Marc Antonini, I3S Lab., CNRS, Univ. of Nice-Sophia Antipolis (France)


Published in SPIE Proceedings Vol. 7526:
Three-Dimensional Image Processing (3DIP) and Applications
Atilla M. Baskurt, Editor(s)

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