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Proceedings Paper

Research on width detection of building crack algorithm in embedded system based on image
Author(s): Zhanhua Huang; Jinjing Li; Meng You; Meng Zhu
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Paper Abstract

The width of the crack is an important indicator in evaluation of the quality of the buildings. Hand-held embedded device used for measuring the width of the cracks can reduces the labor intensity of staff, improve the efficiency and reliability of measurement. In width measuring based on embedded image processing, some problems are existed, such as: "isolated island" noise, the edge of burr which reduce the accuracy of calculation result. The algorithm in the paper can solve these problems. By means of sub-block to increase the speed of image processing of the cracks, then searched the edge of the crack in the blocks which contains crack. this way can reduce image processing time by at least one order of magnitude while getting the preliminary ruling edge of the crack. Additionally, presents a method that use the basic morphological operations and chain to smooth the edge, then obtains the correct edge of the crack. Finally, get the width of the cracks through "Fast hierarchical vector". Experiments confirmed that the correct width of the crack can be got with this algorithm, Accuracy is up to 50μm.

Paper Details

Date Published: 24 November 2009
PDF: 6 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132Q (24 November 2009); doi: 10.1117/12.839496
Show Author Affiliations
Zhanhua Huang, Tianjin Univ. (China)
Jinjing Li, Tianjin Univ. (China)
Meng You, Tianjin Univ. (China)
Meng Zhu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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