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Proceedings Paper

Influence of spatial sampling on the ultrasonic pulse-echo BEEI-mode imaging technique
Author(s): Cunfu He; Hongmei Yuan; Bin Wu
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Paper Abstract

Defects in the seal area of flexible packages bring out health hazards and economic loss. The ultrasonic Backscattered Echo Envelope Integral (BEEI) imaging technique has been used to detect the seal integrity of hermetically sealed flexible packages. This technique was able to reliably inspect channel defects as small as 50μm in diameter in the seal area of flexible packages. The study of experimental spatial sampling for the BEEI-mode imaging technique was presented. Channel defects ranging from 50 to 150μm in diameter embedded in bonded 2-sheet polyethylene film were used for sample. An immersion spherically focused transducer (center frequency of 22.66 MHz) scanned over sample with a static rectilinear stop-and-go scanning pattern and acquired echo data in varying scanning step from each sample. Two descriptors, the average BEEI value difference (▵BEEI) between defected and intact regions and contrast-to-noise ratio (CNR), were defined to quantitatively assess the BEEI-mode image quality versus varying scanning step size and varying sized defects. For any given defects, the ▵BEEI and CNR degraded as scanning step size increased. Detailed imaging of defects can be acquired when the step size is small than echo focal beam diameter, and the image become partial or completely distorted when the step size exceeds twice of the beam diameter.

Paper Details

Date Published: 25 August 2009
PDF: 6 pages
Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73755R (25 August 2009); doi: 10.1117/12.839354
Show Author Affiliations
Cunfu He, Beijing Univ. of Technology (China)
Hongmei Yuan, Beijing Univ. of Technology (China)
Bin Wu, Beijing Univ. of Technology (China)

Published in SPIE Proceedings Vol. 7375:
ICEM 2008: International Conference on Experimental Mechanics 2008
Xiaoyuan He; Huimin Xie; YiLan Kang, Editor(s)

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