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Proceedings Paper

Optical 3D shape measurement for nano-scale thin film buckling
Author(s): S. B. Wang; Y. Xiao; H. K. Jia; L. A. Li
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Paper Abstract

This research focused on observing and measuring the 3D shape for nano-scale thin film buckling of 150nm Ti-film material deposited on organic glass substrates. With the aid of an optical microscope (2000×), the particular approaches were designed using optical wedge stepped in horizontal displacement approach and micro mechanical vertical displacement approach. The 3D shape measurement of thin film buckling on nano-scale level was carried out based on focusing-evaluation-function theory, gaussian interpolation and other theories related to digital image. After comparing the different measuring results and data from different focusing evaluation functions, an error analysis was established on the nature of such functions. In this experiment, we only focused on the measurement on the 3D shape for 150nm-thick thin film buckling. This research makes promotion in measurement on 3D shape of thin film buckling on nano-scale level.

Paper Details

Date Published: 25 August 2009
PDF: 6 pages
Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73755L (25 August 2009); doi: 10.1117/12.839348
Show Author Affiliations
S. B. Wang, Tianjin Univ. (China)
Y. Xiao, Tianjin Univ. (China)
H. K. Jia, Tianjin Univ. (China)
L. A. Li, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 7375:
ICEM 2008: International Conference on Experimental Mechanics 2008
Xiaoyuan He; Huimin Xie; YiLan Kang, Editor(s)

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