Share Email Print

Proceedings Paper

Investigation of interface damage in metal substrate/ceramic coating
Author(s): Jinlong Chen; Zhihui Fan; Wenran Gong; Xinhua Ji
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, the FEA software (ABAQUS) is used to establish the theoretical modeling. The stress distribution on the metal substrate/ ceramic coating structure is analyzed, and the reasons for the ceramic failure are found. Different from the former researcher, we consider that the cohesive element is more appropriate to simulate the delamination growth. In the bending simulation process, it is found that the tension stress will reach its peak in the bending centre with the elastic modulus ratio of coating to substrate increases, while the shear stress will reach its peak in the fixed-side with the thickness of the coating decreases. The existence of the interface layer can sharply reduce the stress gradient from ceramic coating to metal substrate. So failure of the coating is mainly caused by the tension stress, and destruction of the edge is mainly produced by the shear stress. During delamination simulation, the length of delamination and the thickness of the ceramic have a development out of direct proportion. The ceramic coating is easy to be caused damage when the thickness of ceramic is thin, otherwise, the structure delamination will easily be caused.

Paper Details

Date Published: 25 August 2009
PDF: 6 pages
Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73755I (25 August 2009); doi: 10.1117/12.839345
Show Author Affiliations
Jinlong Chen, Tianjin Univ. (China)
Zhihui Fan, Tianjin Univ. (China)
Wenran Gong, Tianjin Univ. (China)
Xinhua Ji, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 7375:
ICEM 2008: International Conference on Experimental Mechanics 2008
Xiaoyuan He; Huimin Xie; YiLan Kang, Editor(s)

© SPIE. Terms of Use
Back to Top