Share Email Print
cover

Proceedings Paper

On errors of digital image correlation due to speckle patterns
Author(s): Bing Pan; Kemao Qian; Huimin Xie; Anand Asundi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Digital Image Correlation (DIC) is an effective and flexible optical tool for full-field deformation measurement. Some aspects that influence the accuracy and precision of DIC have not been thoroughly investigated. A typical example is that the speckle patterns on the specimen surface as a carrier of deformation information significantly affect the measurement of DIC. The aim of this paper is to investigate the influence of speckle patterns on the displacement measurement error of the DIC. A concise theoretical model is derived, which indicates that the speckle pattern does not introduce systematic error but introduce random error in the measured displacement. Numerical experiments using five speckle patterns with distinctly different intensity distribution taken from actual experiments have been performed to validate the proposed concepts, and the results show that the standard deviation error (i.e. precision) of measured displacement are closely related to the speckle patterns and is in good agreement with the prediction of the proposed theoretical model.

Paper Details

Date Published: 25 August 2009
PDF: 7 pages
Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73754Z (25 August 2009); doi: 10.1117/12.839326
Show Author Affiliations
Bing Pan, Nanyang Technological Univ. (Singapore)
Tsinghua Univ. (China)
Kemao Qian, Nanyang Technological Univ. (Singapore)
Huimin Xie, Tsinghua Univ. (China)
Anand Asundi, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 7375:
ICEM 2008: International Conference on Experimental Mechanics 2008
Xiaoyuan He; Huimin Xie; YiLan Kang, Editor(s)

© SPIE. Terms of Use
Back to Top