Share Email Print
cover

Proceedings Paper

Measuring the radius of curvature of a spherical surface with diffraction method
Author(s): Shiqun Hua; Ying Luo
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new diffraction method for measuring the radius of curvature of a convex spherical surface with a large radius is proposed. It is based on measuring the diffraction intensity profiles produced by a designed slit. This diffraction slit is built up using two straight edges. The upper straight edge remains fixed and the lower one is located on the spherical surface, so that the slit width can be modified with moving the lower straight edge on the spherical surface of a sample. The diffraction patterns are captured by a line CCD, and the extremum positions can be ascertained accurately through applying least-square fitting for the intensity distribution curves. By establishing the relation between the displacements of the lower edge in two mutual perpendicular directions and the radius of curvature of the sample, the radius of curvature of the test spherical surface is obtained. Experimental demonstration of the diffraction method on a spherical surface is performed.

Paper Details

Date Published: 25 August 2009
PDF: 6 pages
Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73754T (25 August 2009); doi: 10.1117/12.839319
Show Author Affiliations
Shiqun Hua, Jiangsu Univ. (China)
Ying Luo, Jiangsu Univ. (China)


Published in SPIE Proceedings Vol. 7375:
ICEM 2008: International Conference on Experimental Mechanics 2008
Xiaoyuan He; Huimin Xie; YiLan Kang, Editor(s)

© SPIE. Terms of Use
Back to Top