Share Email Print
cover

Proceedings Paper

Research of the interaction among holes with digital real-time holography
Author(s): Rongxin Guo; Haiting Xia; Bangcheng Yang; Zebin Fan; Tianchun He
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Hole is one of the most common damages in the material. It is necessary to take the interaction among holes into consideration in the research of damage process of materials. The digital real-time holographic measurement system developed by us is used to measure the out-of-plane displacement of PMMA plates containing holes in this paper. The elastic field for the region which contains multiple holes is different from that of the region with one hole. The variation of elastic field due to the existence of multiple holes demonstrates the interaction among holes. It can be seen from the hologram recorded by the digital real-time holography that the distribution of elastic field is related to the configuration, the orientation and the distance of holes. Both the shielding effect and the amplification effect can be easily observed with the help of the distribution of fringes in hologram. These experimental results testify the credibility of the conclusions proposed by theory and by numerical computation.

Paper Details

Date Published: 24 August 2009
PDF: 5 pages
Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 737536 (24 August 2009); doi: 10.1117/12.839245
Show Author Affiliations
Rongxin Guo, Kunming Univ. of Science and Technology (China)
Haiting Xia, Kunming Univ. of Science and Technology (China)
Bangcheng Yang, Kunming Univ. of Science and Technology (China)
Zebin Fan, Kunming Univ. of Science and Technology (China)
Tianchun He, Kunming Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7375:
ICEM 2008: International Conference on Experimental Mechanics 2008
Xiaoyuan He; Huimin Xie; YiLan Kang, Editor(s)

© SPIE. Terms of Use
Back to Top