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Proceedings Paper

Multidirectional MTF measurement of digital image acquisition devices using a Siemens star
Author(s): Kenichiro Masaoka; Masayuki Sugawara; Yuji Nojiri
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Paper Abstract

We propose a method for measuring the multidirectional modulation transfer function (MTF) of digital image acquisition devices using a Siemens star. There are two leading methods for measuring the MTF: the slanted-edge method and the modulated Siemens star method. The former measures the MTF in the horizontal or vertical spatial frequency based on the line spread function (LSF) derived from the edge profile of a slanted knife-edge image. The latter measures the multidirectional MTF using a pattern circumferentially modulated with continuous gray levels. Our method measures the multidirectional MTF using the multidirectional knife-edges of a Siemens star, which is a simple binary image consisting of radial spokes. The vertical edge of the Siemens star is slightly slanted so that the multidirectional edge profiles are obtained in super-resolution. A portion image consisting of the knife-edge is selected in each direction and rotated so that the knife-edge stands upright with a slight tilt. Along the edge slope detected by fitting a cumulative distribution function to the pixel levels, the pixels are projected onto the horizontal axis, forming the edge profile. The resulting multidirectional MTF computed from the edge profiles is in excellent agreement with that measured by the modulated Siemens star method.

Paper Details

Date Published: 18 January 2010
PDF: 8 pages
Proc. SPIE 7537, Digital Photography VI, 75370V (18 January 2010); doi: 10.1117/12.838889
Show Author Affiliations
Kenichiro Masaoka, NHK Science & Technology Research Labs. (Japan)
Masayuki Sugawara, NHK Science & Technology Research Labs. (Japan)
Yuji Nojiri, NHK Science & Technology Research Labs. (Japan)


Published in SPIE Proceedings Vol. 7537:
Digital Photography VI
Francisco Imai; Nitin Sampat; Feng Xiao, Editor(s)

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