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Proceedings Paper

Damage identification method based on fractal dimension and Shannon entropy
Author(s): Yong Huang; Hui Li; Yongchao Yang
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Paper Abstract

Fractal geometry has been widely used to describe irregular phenomena such as damage in the structure as a new mathematical tool. However, most of structural damage identification methods based on fractal theory have the drawback of being sensitive to noise which restricts their practical application. A new high noise robustness damage identification method based on fractal dimension and Shannon entropy is presented in this paper. The damage index was deduced from the Katz's fractal dimensions of certain sampling points with arithmetic of Shannon entropy. The selection of the number of sampling points for calculating the proposed damage index is also studied in this paper and it can be regarded as a trade-off between the peak value generated by the damage and the stability of the curve of the proposed damage index. As a validation, the proposed method is applied to detect damage in simply supported beams by numerical and experimental study. The successful detection of the damage in the beam demonstrates that the method is capable of estimating the location of the damage. And tests with measurement noise in simulated and the laboratory tested beams demonstrate the strong robustness of the method under the influence of noise with appropriate number of sampling interval for calculating the proposed damage index.

Paper Details

Date Published: 20 October 2009
PDF: 8 pages
Proc. SPIE 7493, Second International Conference on Smart Materials and Nanotechnology in Engineering, 74936J (20 October 2009); doi: 10.1117/12.838726
Show Author Affiliations
Yong Huang, Harbin Institute of Technology (China)
Hui Li, Harbin Institute of Technology (China)
Yongchao Yang, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 7493:
Second International Conference on Smart Materials and Nanotechnology in Engineering
Jinsong Leng; Anand K. Asundi; Wolfgang Ecke, Editor(s)

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