Share Email Print
cover

Proceedings Paper

Texture-based measurement of spatial frequency response using the dead leaves target: extensions, and application to real camera systems
Author(s): Jon McElvain; Scott P. Campbell; Jonathan Miller; Elaine W Jin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The dead leaves model was recently introduced as a method for measuring the spatial frequency response (SFR) of camera systems. The target consists of a series of overlapping opaque circles with a uniform gray level distribution and radii distributed as r-3. Unlike the traditional knife-edge target, the SFR derived from the dead leaves target will be penalized for systems that employ aggressive noise reduction. Initial studies have shown that the dead leaves SFR correlates well with sharpness/texture blur preference, and thus the target can potentially be used as a surrogate for more expensive subjective image quality evaluations. In this paper, the dead leaves target is analyzed for measurement of camera system spatial frequency response. It was determined that the power spectral density (PSD) of the ideal dead leaves target does not exhibit simple power law dependence, and scale invariance is only loosely obeyed. An extension to the ideal dead leaves PSD model is proposed, including a correction term to account for system noise. With this extended model, the SFR of several camera systems with a variety of formats was measured, ranging from 3 to 10 megapixels; the effects of handshake motion blur are also analyzed via the dead leaves target.

Paper Details

Date Published: 18 January 2010
PDF: 11 pages
Proc. SPIE 7537, Digital Photography VI, 75370D (18 January 2010); doi: 10.1117/12.838698
Show Author Affiliations
Jon McElvain, Digital Imaging Systems (United States)
Scott P. Campbell, Digital Imaging Systems (United States)
Jonathan Miller, Digital Imaging Systems (United States)
Elaine W Jin, Aptina Imaging Corp. (United States)


Published in SPIE Proceedings Vol. 7537:
Digital Photography VI
Francisco Imai; Nitin Sampat; Feng Xiao, Editor(s)

© SPIE. Terms of Use
Back to Top