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Proceedings Paper

Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric technique
Author(s): Alexandre S. Shcherbakov; Pedro Moreno Zarate; Joaquin Campos Acosta; Yurij V. Il'n; Il'ya S. Tarasov
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Paper Abstract

The specific approach to characterizing the train-average parameters of low-power picosecond optical pulses with the frequency chirp, arranged in high-repetition-frequency trains, in both time and frequency domains is elaborated for the important case when semiconductor heterolasers operate in the active mode-locking regime. This approach involves the joint Wigner time-frequency distributions, which can be created for those pulses due to exploitation of a novel interferometric technique under discussion. Practically, the InGaAsP/InP-heterolasers generating at the wavelength 1320 nm were used during the experiments carried out and an opportunity of reconstructing the corresponding joint Wigner time-frequency distributions was successfully demonstrated.

Paper Details

Date Published: 5 August 2009
PDF: 9 pages
Proc. SPIE 7386, Photonics North 2009, 73862H (5 August 2009); doi: 10.1117/12.838469
Show Author Affiliations
Alexandre S. Shcherbakov, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Pedro Moreno Zarate, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Joaquin Campos Acosta, Instituto de Física Aplicada, CSIC (Spain)
Yurij V. Il'n, Ioffe Physical-Technical Institute (Russian Federation)
Il'ya S. Tarasov, Ioffe Physical-Technical Institute (Russian Federation)


Published in SPIE Proceedings Vol. 7386:
Photonics North 2009

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