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Proceedings Paper

Radiation results of the SEE test of Xilinx XC3S400 FPGA instances
Author(s): Stefan Korolczuk; Dominik Rybka; Tomasz Szczesniak; Radoslaw Marcinkowski; Łukasz Świderski
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Paper Abstract

In modern High Energy Physics Experiments the electronics modules for controlling and/or data acquisition are very often exposed to high neutron radiation. It's well known that it can cause many failures during work of such systems, even total break downs. In such case, the studies of radiation sensitivity of electronic devices should take place to avoid problems during the lifetime of the experiments. This article describes the Single Event Effects (SEE) tests of Xilinx Spartan3 XC3S400 FPGA populated on Altium Live Design Evaluation Board. The results of the tests are presented and discussed. Additionaly gamma-ray spectrometry analysis of the board has been performed.

Paper Details

Date Published: 6 August 2009
PDF: 7 pages
Proc. SPIE 7502, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2009, 75020P (6 August 2009); doi: 10.1117/12.838253
Show Author Affiliations
Stefan Korolczuk, Warsaw Univ. of Technology (Poland)
Dominik Rybka, Warsaw Univ. of Technology (Poland)
The Andrzej Soltan Institute for Nuclear Studies (Poland)
Tomasz Szczesniak, The Andrzej Soltan Institute for Nuclear Studies (Poland)
Radoslaw Marcinkowski, The Andrzej Soltan Institute for Nuclear Studies (Poland)
Łukasz Świderski, The Andrzej Soltan Institute for Nuclear Studies (Poland)


Published in SPIE Proceedings Vol. 7502:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2009

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