Share Email Print
cover

Proceedings Paper

Research on distortion measurement and calibration technology for TV-seeker
Author(s): Xun Yu; Qian Li; Xu Jiang; Fang Wang; Hui Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to satisfy the detective distance requirements of TV-seeker, dual-CCD scheme is used in its optical imaging system. But the distortion of CCD camera has seriously affected on the image quality, which can not get high-precision image of registration and mosaic. Therefore its quantitative measurement and calibration is the key to the attack accuracy of the precision guided weapon. Aiming at the problem as distortion of TV-seeker, firstly Tsai two-stage method based on radial constraint is used to calibrate the CCD camera whose interior parameter and exterior parameter have been determined. The high performance electronic target is established whose advantages are high contrast, high brightness, excellent uniformity and so on by use of TFT-LCD spatial light modulator and visible image display technology. On basis of this, the distortion measurement system is formed to measure the CCD camera. Then polynomial model is established by applying the inversion algorithm and the measured distortion is calibrated by the least squares fit. The calibrated result shows that the measurement precision using this algorithm is higher than that using the positive one obviously and the average distortion after calibration is better than 0.15%.

Paper Details

Date Published: 20 November 2009
PDF: 11 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111U (20 November 2009); doi: 10.1117/12.838098
Show Author Affiliations
Xun Yu, Xi'an Technological Univ. (China)
Qian Li, Xi'an Technological Univ. (China)
Xu Jiang, Xi'an Institute of Applied Optics (China)
Fang Wang, Xi'an Institute of Applied Optics (China)
Hui Wang, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

© SPIE. Terms of Use
Back to Top