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Proceedings Paper

Content measurement of textile mixture by Fourier transform near infrared spectroscopy
Author(s): Li Liu; Li Yan; Yaocheng Xie; Songzhang Li; Ge Xia; Libin Zhou
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Paper Abstract

A new method for accurate measurement of content of textile mixture based on Fourier transform near infrared spectroscopy is put forward. The near infrared spectra of 56 samples with different cotton and polyester contents were obtained, in which 41 samples, 10 samples and 5 samples were used for the calibration set, validation set and prediction set respectively. The wavelet transform (WT) was utilized for the spectra data compression. From the linear and nonlinear perspective, multivariable linear regression (MLR) model based on the Lambert - Beer's law and back propagation (BP) neural network model based on WT were developed. It indicates that the prediction accuracy of WT-ca3-BP network model is 2% for calibration sample and 4% for validation sample, which is much higher than the MLR model and is suitable for the prediction of unknown samples. On the basis of not changing the structure of the WT-ca3-BP network model, calibration and validation samples were utilized fully to be re-set to new calibration samples, which upgraded this model. The upgraded WT-ca3-BP network model was applied to predict unknown samples. Experimental results show that this approach based on Fourier transform Near Infrared Spectroscopy can be used to quantitative analysis for textile fiber.

Paper Details

Date Published: 20 November 2009
PDF: 9 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110G (20 November 2009); doi: 10.1117/12.838029
Show Author Affiliations
Li Liu, Wuhan Univ. of Science and Engineering (China)
Li Yan, Wuhan Univ. of Science and Engineering (China)
Yaocheng Xie, Wuhan Univ. of Science and Engineering (China)
Songzhang Li, Wuhan Univ. of Science and Engineering (China)
Ge Xia, Wuhan Univ. of Science and Engineering (China)
Libin Zhou, Wuhan Univ. of Science and Engineering (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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