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Proceedings Paper

Optical measurement of atmospheric refractive index structure constants
Author(s): Xiwen Qiang; Jingru Liu; Fei Zong; Junwei Zhao; Yan Li
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Paper Abstract

Atmospheric turbulence increases bit error rate and degrades beams quality for wireless laser communication links as laser light propagation in the turbulent atmosphere, and atmospheric refractive index structure constant is an important parameter for statistics of atmospheric turbulence. Characteristics of atmospheric turbulence in the atmosphere varies randomly and the experiments in the real atmosphere are expensive, so it is an important way to simulate atmospheric turbulence in laboratory for investigation on laser beams propagation in through the atmosphere. The structure parameter of the atmospheric turbulence in laboratory was measured based on measurement of angle-of-arrival (AOA) fluctuations of centroids as laser beam through the simulated-turbulence. The results shows a good agreement with the previous result measured by thermal method, the strength of simulated-turbulence was 1000 times stronger than that in the real atmosphere. The characteristics of turbulence varies temporally with air temperature and wind velocity, and statistics of atmospheric turbulence was presented for various air temperature and wind velocity along the propagation path.

Paper Details

Date Published: 20 November 2009
PDF: 6 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Q (20 November 2009); doi: 10.1117/12.837988
Show Author Affiliations
Xiwen Qiang, Xi'an Jiaotong Univ. (China)
Northwest Institute of Nuclear Technology (China)
Jingru Liu, Northwest Institute of Nuclear Technology (China)
Fei Zong, Northwest Institute of Nuclear Technology (China)
Junwei Zhao, Northwest Institute of Nuclear Technology (China)
Yan Li, Northwest Institute of Nuclear Technology (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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