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Proceedings Paper

The research on promoting the measuring accuracy of UV radiometers
Author(s): Bo Huang; Caihong Dai; Jailin Yu
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Paper Abstract

The aim of this paper is to promote the accuracy of the quantity for spectral irradiance of standard lamps at transferring, optimize the calibration uncertainty of ultraviolet irradiance, analyze and solve the problem which will effect the measuring course of ultraviolet irradiance, and provide reliable calibration standard for application areas. The main contents include: 1. Put forward a new three segment fitting function of spectral irradiance of standard lamp and an optimizing method for non-linear parameter. Compare relative errors of different curve fitting methods by a new successive error analysis method. The relative deviation of the new curve fitting function is: 0.27% between 250nm and 2500nm which is acceptable comparing to the uncertainty of national primary standard of spectral irradiance lamp. 2. Through a new designed measurement system for cosine response property of UV radiometers, we do some measuring experiments to 21 kinds of UV radiometers and calculate the relative deviation of each UV meters. By measuring experiments we can understand the cosine response property of UV radiometers exactly and do cosine compensation accordingly. 3. Design and fulfill an experimental system to reflect the measuring errors of UV radiometers when measuring sources and calibrated sources are mismatched. Calculate the spectral mismatch correction factor and spectral matching characteristic factor to modify the measuring data.

Paper Details

Date Published: 20 November 2009
PDF: 17 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751108 (20 November 2009); doi: 10.1117/12.837955
Show Author Affiliations
Bo Huang, National Institute of Metrology (China)
Caihong Dai, National Institute of Metrology (China)
Jailin Yu, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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