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Proceedings Paper

Spatial phase-shifting moire deflectometry
Author(s): Yang Song; YunYun Chen; Anzhi He; Zhimin Zhao
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Paper Abstract

A novel spatial phase-shifting method is presented from the moire phenomena. With the analysis to moire patterns from the scalar diffraction theory, there is stable phase shift between different order diffraction interferograms of moire deflectometry. This phase shift just depends on the distance between two gratings and the grating period. In this spatial phase-shifting method, no beam splitter, polarizer or wave plate is used and the disadvantage of uncertain phase shifts due to the methods using polarizer or wave plate is removed.

Paper Details

Date Published: 24 November 2009
PDF: 6 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751305 (24 November 2009); doi: 10.1117/12.837902
Show Author Affiliations
Yang Song, Nanjing Univ. of Science and Technology (China)
Nanking Univ. of Aeronautics and Astronautics (China)
YunYun Chen, Nanjing Univ. of Science and Technology (China)
Anzhi He, Nanjing Univ. of Science and Technology (China)
Zhimin Zhao, Nanking Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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