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Proceedings Paper

Rigorous vector analysis of diffractive microlens by using the finite-difference time-domain method
Author(s): Yuling Liu; Hua Liu
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Paper Abstract

We use finite difference time domain (FDFD) method as rigorous vector analysis model to simulate the focusing process of diffractive microlens (DML). Differing with most analysis model which the near field distributions are calculated by FDTD and then far field are obtained by using of propagation method, we obtain the fields in whole computational space by using of FDTD only. The advantages are that all the results are vector based and the computational time is saved greatly. In this paper, we present two methods to obtain wave amplitude, one is comparison method, and the other is integral method. Depending on wave amplitude in the whole computational space, one can conveniently obtain distributions of electric field intensity and calculate the time-average Poynting vector. We also present the formulation for calculating diffractive efficiency of DML based on time-average Poynting vector which denotes energy flow. As demonstration, a DML is analyzed by using of these algorithms. The time depended graphic results of FDTD show the process of wave propagation. The distribution of electric field intensity illustrates the focusing of the normal incident light. The focus pattern in the focal plane is also show. The diffractive efficiency of the DML is calculated by using of the energy flow method in this paper. The results show the high accuracy and efficiency of the model.

Paper Details

Date Published: 20 November 2009
PDF: 8 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750614 (20 November 2009); doi: 10.1117/12.837849
Show Author Affiliations
Yuling Liu, Zhejiang Univ. of Technology (China)
Hua Liu, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)

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