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Proceedings Paper

Analysis of film thickness for magnetron sputtering system with more than one workbench
Author(s): Tao Wang; He Yu; Zhiming Wu; Yadong Jiang; Jing Jiang
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Paper Abstract

In this article, the thickness uniformity of thin films deposited by magnetron sputtering system involved in both planetary circumrotate model and traditional model by rectangle target were investigated respectively. It was shown that the thickness uniformity of films by magnetron sputtering system with rotation and revolution at the optimum ratio value of Wz/Wg 0.5 is superiority to traditional system which with 0.3 of thickness relative deviation at coordinative condition. Moreover, the relative deviation was dropped as the addition of distance from substrate to target. The results were in accord with that obtained experimentally.

Paper Details

Date Published: 30 November 2009
PDF: 9 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75062B (30 November 2009); doi: 10.1117/12.837841
Show Author Affiliations
Tao Wang, Univ. of Electronic Science and Technology of China (China)
He Yu, Univ. of Electronic Science and Technology of China (China)
Zhiming Wu, Univ. of Electronic Science and Technology of China (China)
Yadong Jiang, Univ. of Electronic Science and Technology of China (China)
Jing Jiang, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)

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