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Proceedings Paper

Analysis for angle anisoplanatic effect of the steady thermal blooming
Author(s): Yunqiang Sun; Fengjie Xi; Xiaojun Xu; Qisheng Lu; Wuming Wu; Hongbin Chen
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Paper Abstract

The effect of beacon Anisoplanatism needs to be considered in analyzing the error of the adaptive optical system. Therefore, thermal blooming anisoplanatic effect of the Gaussian beam is analyzed numerically and theoretically. Wavefront distortion of the Gaussian beam caused by thermal blooming anisoplanatic effect is expanded by the Zernike polynomials. The Zernike coefficient and the fitting error are obtained by numerical calculations. The comparisons between the Zernike coefficients indicate that the defocus item is the most important to the angular anisoplanatic error. Based on the Wave-front distortion caused by the thermal blooming angular anisoplanatic effect, the defocus coefficient of the Zernike polynomials is obtained theoretically. The result of the angular anisoplanatic error calculated by theoretical formula is consistent with the outcome of the numerical calculation, and the result also indicates that the angular anisoplanatic error is the function of the caliber size and varies as the square of the anisoplanatic angle. The square relation of angle anisoplanatism is consistent with the result obtained by the turbulence angular anisoplanatic effect.

Paper Details

Date Published: 20 November 2009
PDF: 7 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111D (20 November 2009); doi: 10.1117/12.837820
Show Author Affiliations
Yunqiang Sun, National Univ. of Defense Technology (China)
Institute of Optics and Electronics (China)
Fengjie Xi, National Univ. of Defense Technology (China)
Institute of Optics and Electronics (China)
Xiaojun Xu, National Univ. of Defense Technology (China)
Qisheng Lu, National Univ. of Defense Technology (China)
Wuming Wu, National Univ. of Defense Technology (China)
Hongbin Chen, National Univ. of Defense Technology (China)
Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems

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