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Proceedings Paper

Depth measurement using infrared thermography
Author(s): Yan Huo; Yue-jin Zhao; Cun-lin Zhang; Yan-hong Li; Zhi Zeng
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Paper Abstract

Infrared Thermography is a Nondestructive Testing and Evaluating (NDT&E) technique. it is an effective technique for quantitative prediction of defect depth and defect area, an analysis of depth measurement based on theoretical one-dimensional solution of pulsed thermography is used, assuring the depth of defects by calculating break time that the Logarithmic time evolution of the health area begins to deviate from that of the defective area. Several back-drilled flat-bottom holes which located at three different depths in the aluminum plate are used as simulated defects. Meanwhile, other two coating samples buried with nine defects are also detected. The experimental results of the infrared thermography can demonstrate the capability to predict the depth of defects. The advantages and disadvantages of this method are also outlined.

Paper Details

Date Published: 20 November 2009
PDF: 6 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110N (20 November 2009); doi: 10.1117/12.837816
Show Author Affiliations
Yan Huo, Beijing Institute of Technology (China)
Yue-jin Zhao, Beijing Institute of Technology (China)
Cun-lin Zhang, Capital Normal Univ. (China)
Yan-hong Li, Beijing Institute of Technology (China)
Zhi Zeng, Chongqing Normal Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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