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Proceedings Paper

Level 0 and Level 1 data processing for a type of hyperspectral imager
Author(s): Xiaohui Li; Changxiang Yan
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Paper Abstract

Hyper-spectral imaging (HSI) is a kind of optical remote sensor that can simultaneously obtain spatial and spectral information of ground targets. We are now designing a data processing system for a type of space-borne push-broom HSI, which has 128 spectral channels covering the spectral range from 400nm to 2500nm. With its large amount of spectral channels, the HSI collects large volume of spectral imaging data need to be efficiently and accurately processed and calibrated. In this paper, the detailed Level 0 and Level 1 data processing steps for the HSI were presented. The Level 0 processing refers to a set of tasks performed on the data downlinked from the spacecraft, including decoding to extract science data, separating the science data into files corresponding to different tasks (e.g. ground imaging, dark imaging, and onboard calibration), checking data integrity and instrument settings, data format conversion, and Level 0 files creation. The Level 1 processing performs several steps on Level 0 data. Firstly, it corrects the image artifacts (mostly the SWIR smear effect), subtracts the dark background, and performs the bad pixel replacement according to the prelaunch measurement; then it performs radiometric and spectral calibration based on the ground calibration results and onboard calibration collection. The detailed algorithms for bad pixel replacement, radiometric and spectral calibration were presented. After processing, the digital numbers downlinked from the spacecraft can be converted into at-sensor absolute spectral radiance of ground targets, thus providing accurate quantified spectral imaging data for various applications.

Paper Details

Date Published: 24 November 2009
PDF: 7 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130P (24 November 2009); doi: 10.1117/12.837796
Show Author Affiliations
Xiaohui Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Changxiang Yan, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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