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Proceedings Paper

A novel method measuring optical fiber nonlinear coefficient based on XPM
Author(s): Shuangxi Zhang; Xuqiang Wu; Fei Ai; Chengmei Zhang; Bo Zhang; Benli Yu
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Paper Abstract

In optic communication systems, the nonlinear effect of the optical fiber is of great importance. There are several methods measuring optical fiber nonlinear coefficient. A novel method measuring optical fiber nonlinear coefficient is proposed, which is based on a Mach-Zehnder interferometer fabricated with 3×3 coupler, polarization controller and so on. According to cross phase modulation (XPM), when two optical waves are injected into the same optical fiber, the phase of one optical wave will be changed because of the other one. So a sinusoidal phase signal will be generated through coupling a sinusoidal modulated high-power laser into one arm of the interferometer, and then the three outputs of the interferometer will contain the sinusoidal phase signal. According to the characteristic of the 3×3 coupler, the phase difference between the three outputs is 2π / 3 . Through mathematics disposition of the three outputs of the interferometer, a couple of orthogonal signals can be yielded. Then the amplitude of the sinusoidal phase signal can be demodulated accurately by arctan method. The length of the optical fiber and the power of the laser can be measured easily, according to expression about the nonlinear phase shift induced by XPM, the optical fiber nonlinear coefficient of certain wavelength will be calculated. The optical fiber nonlinear effect is simulated by the software optisystem, and the process measuring the optical fiber nonlinear coefficient is analyzed in detail based on the schematic design.

Paper Details

Date Published: 20 November 2009
PDF: 8 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751117 (20 November 2009); doi: 10.1117/12.837737
Show Author Affiliations
Shuangxi Zhang, Anhui Univ. (China)
Xuqiang Wu, Anhui Univ. (China)
Fei Ai, Anhui Univ. (China)
Chengmei Zhang, Anhui Univ. (China)
Bo Zhang, Anhui Univ. (China)
Benli Yu, Anhui Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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