Share Email Print
cover

Proceedings Paper

Single-image based dimensions inspection technology for planar industrial parts
Author(s): Ji-hua Chen; Yan-yun Jiang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The industrial parts' dimensions are the important characteristics for their eligibility evaluation; typically, the multiple cameras system is the preferred technology that fitting the inspection, especially for on-line testing, but the cameras calibration, images matching, etc. are necessary when put in practice, also, multiple cameras system is either too costly or impractical sometimes. A novel dimensions inspection technology based on single-image for planar industrial parts is presented. The technology described here uses single-image taken by a camera in arbitrary pose, and requires four scale-bars with known distances sticking on the planar industrial part, the four known distances are used to correct the single-image to normal, and the part's dimensions are obtained by triangulation comparability from the normal image. The utilities of this method are its low-cost, simplicity, ease of implementation and camera calibration needless. The technology is being used in the real-time inspection of precision machining for the evaporator tubes plate of nuclear boiler, applications show that the method is effective, and the typical dimensions accuracy is 0.05 mms if the testing range is about 0.5ms by 0.5ms per-time.

Paper Details

Date Published: 20 November 2009
PDF: 10 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751115 (20 November 2009); doi: 10.1117/12.837650
Show Author Affiliations
Ji-hua Chen, Beihang Univ. (China)
Yan-yun Jiang, Shanghai Boiler Works Ltd. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

© SPIE. Terms of Use
Back to Top