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Proceedings Paper

Direct surface relief formation in As-S(Se) layers
Author(s): M. Trunov; P. Lytvyn; P. M. Nagy; Cs. Cserhati; I. Charnovich; S. Kokenyesi
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Paper Abstract

The process of holographic recording based on a direct formation of periodic surface relief in AsxSe1-x (0 ≤ x ≤ 0.5) and As2S3 layers was investigated by in situ AFM depth profiling and compared with data on diffraction efficiency η of the similar relief holographic gratings, measured in a reflection mode. It is established, that the time (exposure) dependence of η has at least two components, which are connected with different components of the surface deformation Δd and relief formation up to the giant, Δd/d >10% changes in the best As0.2Se0.8 or As2S3 compositions. Correlation is found between light and e-beam induced surface deformations during recording in similar compositions. Applications for prototyping phase-modulated optoelectronic elements are considered.

Paper Details

Date Published: 26 February 2010
PDF: 5 pages
Proc. SPIE 7598, Optical Components and Materials VII, 75981H (26 February 2010); doi: 10.1117/12.837604
Show Author Affiliations
M. Trunov, Uzhgorod National Univ. (Ukraine)
P. Lytvyn, V. Lashkaryov Institute of Semiconductor Physics (Ukraine)
P. M. Nagy, Central Institute of Chemical Researches (Hungary)
Cs. Cserhati, The Univ. of Debrecen (Hungary)
I. Charnovich, The Univ. of Debrecen (Hungary)
S. Kokenyesi, The Univ. of Debrecen (Hungary)


Published in SPIE Proceedings Vol. 7598:
Optical Components and Materials VII
Shibin Jiang; Michel J. F. Digonnet; John W. Glesener; J. Christopher Dries, Editor(s)

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