Share Email Print
cover

Proceedings Paper

Direct PSF estimation using a random noise target
Author(s): Johannes Brauers; Claude Seiler; Til Aach
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Conventional point spread function (PSF) measurement methods often use parametric models for the estimation of the PSF. This limits the shape of the PSF to a specific form provided by the model. However, there are unconventional imaging systems like multispectral cameras with optical bandpass filters, which produce an, e.g., unsymmetric PSF. To estimate such PSFs we have developed a new measurement method utilizing a random noise test target with markers: After acquisition of this target, a synthetic prototype of the test target is geometrically transformed to match the acquired image with respect to its geometric alignment. This allows us to estimate the PSF by direct comparison between prototype and image. The noise target allows us to evaluate all frequencies due to the approximately "white" spectrum of the test target - we are not limited to a specifically shaped PSF. The registration of the prototype pattern gives us the opportunity to take the specific spectrum into account and not just a "white" spectrum, which might be a weak assumption in small image regions. Based on the PSF measurement, we perform a deconvolution. We present comprehensive results for the PSF estimation using our multispectral camera and provide deconvolution results.

Paper Details

Date Published: 19 January 2010
PDF: 10 pages
Proc. SPIE 7537, Digital Photography VI, 75370B (19 January 2010); doi: 10.1117/12.837591
Show Author Affiliations
Johannes Brauers, RWTH Aachen Univ. (Germany)
Claude Seiler, RWTH Aachen Univ. (Germany)
Til Aach, RWTH Aachen Univ. (Germany)


Published in SPIE Proceedings Vol. 7537:
Digital Photography VI
Francisco Imai; Nitin Sampat; Feng Xiao, Editor(s)

© SPIE. Terms of Use
Back to Top