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Proceedings Paper

Design of an MCU-controlled laser liquid turbidimeter based on OPT101
Author(s): Yang Liu; Huiying Xu
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Paper Abstract

With the rapid development of industry, accurate detection of liquid turbidity has attracted more and more attention, and been widely applied to many industries. According to the Mie scattering and the Rayleigh scattering law, this paper presents a novel design of laser liquid turbidimeter which uses the method of determining the turbidity by means of detecting the 90° scattered light. The entire detection system mainly consists of a 650nm red laser source, a light receiver (OPT101) and photoelectric conversion devices, an A/D converter, a data processing and controlling unit, a screen display device (LCD) and a power supply module. This turbidimeter is proved to be an intelligent instrument, which makes the process of measuring greatly simplified by displaying the result of turbidity in a digital form directly. It operates normally at a temperature range from 0 oC to 50 oC . From 0 NTU to 1000 NTU, the measuring ranges can be adjusted in accordance with the situation of samples automatically, and a single measurement takes about 1.608 ms. A high precision of 0.001 NTU is realized in our experiments. After repeated measurements, an average error of ±2.2% is obtained, and the repeatability is less than 1%. Moreover, two measuring modes are provided, one can store and view the measuring records repeatedly, while the other can be used for batch testing with an additional alarm device. This turbidimeter possesses a good practicality either in laboratory measurement or in industrial and environmental inspection.

Paper Details

Date Published: 20 November 2009
PDF: 12 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751110 (20 November 2009); doi: 10.1117/12.837510
Show Author Affiliations
Yang Liu, Xiamen Univ. (China)
Huiying Xu, Xiamen Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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