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Proceedings Paper

Study on infrared optical switching of vanadium dioxide thin film
Author(s): Haifang Wang; Yi Li; Xiaojing Yu; Huiqun Zhu; Yize Huang; Hu Zhang; Wei Zhang
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Paper Abstract

Dispersion theory for refractive index and extinction coefficient of vanadium dioxide thin film is studied, and its temperature-dependence dispersion formula of optical constants is presented by numerical fitting with Sellmeier dispersion model. The optical transmittance and reflectance at different temperature and wavelength is calculated using film matrix theory. Vanadium dioxide thin films with different thickness are deposited by magnetron sputtering on glass, sapphire and silicon dioxide substrates, and the optical transmittance and reflectivity of the films are measured, and the experiment curve agrees well with that of simulation.

Paper Details

Date Published: 25 November 2009
PDF: 8 pages
Proc. SPIE 7509, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 75090P (25 November 2009); doi: 10.1117/12.837452
Show Author Affiliations
Haifang Wang, Univ. of Shanghai for Science and Technology (China)
Yi Li, Univ. of Shanghai for Science and Technology (China)
Shanghai Key Lab. of Modern Optical Systems (China)
Xiaojing Yu, Univ. of Shanghai for Science and Technology (China)
Huiqun Zhu, Univ. of Shanghai for Science and Technology (China)
Wuyi Univ. (China)
Yize Huang, Univ. of Shanghai for Science and Technology (China)
Hu Zhang, Univ. of Shanghai for Science and Technology (China)
Wei Zhang, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 7509:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration
Xuping Zhang; Wojtek J. Bock; Xuejun Lu; Hai Ming, Editor(s)

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