Share Email Print
cover

Proceedings Paper

System for variable stripe length optical gain measurements in structures containing silicon nanocrystals
Author(s): D. Koshel; D. Barba; F. Martin; G. G. Ross
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The variable stripe length (VSL) is a convenient method for the measurement of optical gain. However, several inherent experimental constraints such as pump beam non-uniformity, diffraction from the movable cache and sample edges, and gain saturation challenge its proper implementation. A modified VSL configuration, which addresses these constraints, has been developed and implemented for gain measurements in SiO2 structures containing silicon nanocrystals. A microprocessor based acquisition of several control parameters provides reliable and reproducible optical gain measurements.

Paper Details

Date Published: 4 August 2009
PDF: 8 pages
Proc. SPIE 7386, Photonics North 2009, 73860X (4 August 2009); doi: 10.1117/12.836995
Show Author Affiliations
D. Koshel, INRS-EMT, Univ. du Québec (Canada)
D. Barba, INRS-EMT, Univ. du Québec (Canada)
F. Martin, INRS-EMT, Univ. du Québec (Canada)
G. G. Ross, INRS-EMT, Univ. du Québec (Canada)


Published in SPIE Proceedings Vol. 7386:
Photonics North 2009
Réal Vallée, Editor(s)

© SPIE. Terms of Use
Back to Top