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Proceedings Paper

System for variable stripe length optical gain measurements in structures containing silicon nanocrystals
Author(s): D. Koshel; D. Barba; F. Martin; G. G. Ross
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Paper Abstract

The variable stripe length (VSL) is a convenient method for the measurement of optical gain. However, several inherent experimental constraints such as pump beam non-uniformity, diffraction from the movable cache and sample edges, and gain saturation challenge its proper implementation. A modified VSL configuration, which addresses these constraints, has been developed and implemented for gain measurements in SiO2 structures containing silicon nanocrystals. A microprocessor based acquisition of several control parameters provides reliable and reproducible optical gain measurements.

Paper Details

Date Published: 4 August 2009
PDF: 8 pages
Proc. SPIE 7386, Photonics North 2009, 73860X (4 August 2009); doi: 10.1117/12.836995
Show Author Affiliations
D. Koshel, INRS-EMT, Univ. du Québec (Canada)
D. Barba, INRS-EMT, Univ. du Québec (Canada)
F. Martin, INRS-EMT, Univ. du Québec (Canada)
G. G. Ross, INRS-EMT, Univ. du Québec (Canada)


Published in SPIE Proceedings Vol. 7386:
Photonics North 2009
Réal Vallée, Editor(s)

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