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Proceedings Paper

Process for rapid detection of fratricidal defects on optics using linescan phase-differential imaging
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Paper Abstract

Phase-defects on optics used in high-power lasers can cause light intensification leading to laser-induced damage of downstream optics. We introduce Linescan Phase Differential Imaging (LPDI), a large-area dark-field imaging technique able to identify phase-defects in the bulk or surface of large-aperture optics with a 67 second scan-time. Potential phase-defects in the LPDI images are indentified by an image analysis code and measured with a Phase Shifting Diffraction Interferometer (PSDI). The PSDI data is used to calculate the defects potential for downstream damage using an empirical laser-damage model that incorporates a laser propagation code. A ray tracing model of LPDI was developed to enhance our understanding of its phase-defect detection mechanism and reveal limitations.

Paper Details

Date Published: 31 December 2009
PDF: 11 pages
Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75041B (31 December 2009); doi: 10.1117/12.836990
Show Author Affiliations
Frank L. Ravizza, Lawrence Livermore National Lab. (United States)
Michael C. Nostrand, Lawrence Livermore National Lab. (United States)
Laura M. Kegelmeyer, Lawrence Livermore National Lab. (United States)
Ruth A. Hawley, Lawrence Livermore National Lab. (United States)
Michael A. Johnson, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 7504:
Laser-Induced Damage in Optical Materials: 2009
Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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