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Proceedings Paper

Study of superficial stress gradients by computer simulation and x-ray diffraction experiment
Author(s): Joaquim T. Assis; Vladimir I. Monin; Susana M. Iglesias
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Paper Abstract

Study of stress gradients is one of the important problems of the X-ray tensometry, especially, in the case of analysis of residual stress state arising after different modern treatments like material modifications by ion beam technologies or surface treatments by laser. These problems related directly with incompleteness of theoretical and experimental measurement techniques with using of X-ray diffraction for study of stress gradients and they are connected with nonlinear character of dependency of diffraction angle θφ,ψ versus sin2ψ and with broadening of diffraction line caused by surface stress gradient. Computer simulation gives possibility to resolve the problem of determination of stress state characterized by strong gradient. The objective of presented paper is to develop a methodology of determination of stress gradient parameters. The methodology is based on computer simulation of diffraction line and permits to make corrections of stress measurements made by diffraction sin2ψ-method.

Paper Details

Date Published: 17 June 2009
PDF: 6 pages
Proc. SPIE 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations, 73770T (17 June 2009); doi: 10.1117/12.836980
Show Author Affiliations
Joaquim T. Assis, Rio de Janeiro State Univ. (Brazil)
Vladimir I. Monin, Rio de Janeiro State Univ. (Brazil)
Susana M. Iglesias, Rio de Janeiro State Univ. (Brazil)

Published in SPIE Proceedings Vol. 7377:
Twelfth International Workshop on Nanodesign Technology and Computer Simulations
Alexander I. Melker; Vladislav V. Nelayev, Editor(s)

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