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Proceedings Paper

The combined influence of low-flux electrons irradiation and weak magnetic field on silicon microhardness
Author(s): Yuriy I. Golovin; Alexander A. Dmitrievskiy; Nadezhda Yu. Efremova; Vladimir M. Vasyukov
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Paper Abstract

The combined influence of low-flux electron irradiation and weak magnetic and electric fields on silicon single-crystal microhardness was investigated. It is shown that the microhardness is more sensitive to low-doses effects irradiation than conductivity. The effect of magnetic and electric fields on the process of secondary radiation defects generation was revealed.

Paper Details

Date Published: 17 June 2009
PDF: 5 pages
Proc. SPIE 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations, 73770M (17 June 2009); doi: 10.1117/12.836914
Show Author Affiliations
Yuriy I. Golovin, Tambov State Univ. (Russian Federation)
Alexander A. Dmitrievskiy, Tambov State Univ. (Russian Federation)
Nadezhda Yu. Efremova, Tambov State Univ. (Russian Federation)
Vladimir M. Vasyukov, Tambov State Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 7377:
Twelfth International Workshop on Nanodesign Technology and Computer Simulations
Alexander I. Melker; Vladislav V. Nelayev, Editor(s)

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