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Proceedings Paper

Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor
Author(s): Vo Thanh Tung; Sergey A. Chizhik; V. V. Chikunov; Tran Xuan Hoai
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Paper Abstract

A high-resolution atomic force microscopy using a quartz tuning fork in ambient conditions has been developed, which operates in two modes: tapping and shear modes. In our designs, a tungsten tip, with radius about 30-50nm, was attached to one prong of the tuning fork. Furthermore, a combination of the transducer and AFM NT-206 (Belarus) allows the assembly of system of tuning fork gluing tungsten tip to retain a high quality factor of up to 9000. These results lead to the possibility of commercial applications of a simple, user-friendly and advantage system for atomic force microscopy.

Paper Details

Date Published: 17 June 2009
PDF: 7 pages
Proc. SPIE 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations, 73770L (17 June 2009); doi: 10.1117/12.836902
Show Author Affiliations
Vo Thanh Tung, A.V. Luikov Heat and Mass Transfer Institute (Belarus)
Institute of Applied Physics and Scientific Instruments (Viet Nam)
Sergey A. Chizhik, A.V. Luikov Heat and Mass Transfer Institute (Belarus)
V. V. Chikunov, A.V. Luikov Heat and Mass Transfer Institute (Belarus)
Tran Xuan Hoai, Institute of Applied Physics and Scientific Instruments (Viet Nam)


Published in SPIE Proceedings Vol. 7377:
Twelfth International Workshop on Nanodesign Technology and Computer Simulations
Alexander I. Melker; Vladislav V. Nelayev, Editor(s)

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