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Proceedings Paper

Molecular dynamics study on Young's modulus of silicon nanostructures at finite temperature
Author(s): Yabin Wang; Hong Yu
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Paper Abstract

In this paper, we investigate Young's modulus of Si nanofilms and Si nanowires under surface reconstruction with different temperature range from 100K to 800K by Molecular dynamics simulations. Young's modulus is calculated from energy-strain relationship. The results show that the Young's modulus of Si nanofilms decreases as temperature increases. The temperature effect on Young's modulus of Si nanowires also could not be ignored. Surface effect on nanostructures is more significant than on macrostructures, and Si nanostructures are more sensitive to heat.

Paper Details

Date Published: 24 August 2009
PDF: 7 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73812U (24 August 2009); doi: 10.1117/12.836706
Show Author Affiliations
Yabin Wang, Southeast Univ. (China)
Hong Yu, Southeast Univ. (China)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

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