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Proceedings Paper

Preparation and characterization of polycrystalline iodized mercury thick films for detector array
Author(s): Junyang Yu; Weimin Shi; Dongmei Li; Juan Qin; Linjun Wang; Weifeng Zheng; Tingting Xiong; Yiben Xia
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Paper Abstract

The polycrystalline mercuric iodide thick-film array was deposited by hot wall physical vapor deposition (HWPVD) method using an aluminum alloy mask. The pixel size of the 4×4 array is 5×5 mm2, and pixel spacing is about 0.2mm. Comparative study of the quality of the films grown on different pixels (type A, B, C) was conducted by Atomic force microscopy (AFM), Scanning electron microscopy (SEM), X-ray diffraction (XRD), and Raman spectroscopy. The results showed that films of all types were all compactly formed by separated columnar monocrystallines with uniform orientation along c-direction and had similar crystalline structures, indicating that the thick films deposited on the substrate had a good uniformity as a whole, and of all the three different type samples, type A were of the relatively highest quality.

Paper Details

Date Published: 5 August 2009
PDF: 7 pages
Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851S (5 August 2009); doi: 10.1117/12.836663
Show Author Affiliations
Junyang Yu, Shanghai Univ. (China)
Weimin Shi, Shanghai Univ. (China)
Dongmei Li, Shanghai Univ. (China)
Juan Qin, Shanghai Univ. (China)
Linjun Wang, Shanghai Univ. (China)
Weifeng Zheng, Shanghai Univ. (China)
Tingting Xiong, Shanghai Univ. (China)
Yiben Xia, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 7385:
International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications
X.-C. Zhang; James M. Ryan; Cun-lin Zhang; Chuan-xiang Tang, Editor(s)

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