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Proceedings Paper

Paraxial imaging electron optics and its spatial-temporal aberrations for a bi-electrode concentric spherical system with electrostatic focusing
Author(s): Li-wei Zhou; Hui Gong; Zhi-quan Zhang; Yi-fei Zhang
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Paper Abstract

As is known, the paraxial solutions play an important role in studying electron optical imaging system and its aberrations, but the investigation of a bi-electrode concentric spherical system with electrostatic focusing directly from paraxial electron ray equation and paraxial electron motion equation has not been done before. In this paper, we shall use the paraxial equations to study the spatial-temporal trajectories and their aberrations for a bi-electrode concentric spherical system with electrostatic focusing. In the present paper, start from the paraxial electron ray equation and paraxial electron motion equation, the paraxial spatial-temporal trajectory of moving electron emitted from the cathode has been solved for a bi-electrode concentric spherical system with electrostatic focusing. The paraxial static and dynamic imaging electron optics, as well as the paraxial spatial-temporal aberrations in this system are then discussed, the regularity of paraxial imaging optical properties has been given. The paraxial spatial aberrations, as well as the paraxial temporal aberrations with different orders, have been defined and deduced, that are classified by the order of (εz/Φac)1/2 and (εr/Φac)1/2. The same conclusions about paraxial spatial and temporal aberrations as we have done before will be given.

Paper Details

Date Published: 6 August 2009
PDF: 9 pages
Proc. SPIE 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, 73842U (6 August 2009); doi: 10.1117/12.836634
Show Author Affiliations
Li-wei Zhou, Beijing Institute of Technology (China)
Hui Gong, Beijing Institute of Technology (China)
Zhi-quan Zhang, Institute of Armored Force Engineering (China)
Yi-fei Zhang, Institute of Armored Force Engineering (China)


Published in SPIE Proceedings Vol. 7384:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications
Kun Zhang; Xiang-jun Wang; Guang-jun Zhang; Ke-cong Ai, Editor(s)

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