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Proceedings Paper

Design and test results of a readout circuit for high energy particle detectors
Author(s): Mingming Zhang; Zhongjian Chen; Yacong Zhang; Wengao Lu; Huiyao An; Lijiu Ji
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Paper Abstract

A readout integrated circuit for high energy particle detectors is presented. The circuit designed is composed of a Charge Sensitive Amplifier (CSA), a pulse shaper with four selectable peaking time, and an output stage. The readout circuit has been designed in a 0.35um DPTM CMOS technology and tested with Verigy 93000. The size of readout circuit is 1.7*0.7mm2. The power supply voltage is 5V. The average gain is about 20.5mV/fC and the Equivalent Noise Charge (ENC) with detector disconnected is 550-650e for five chips in the typical mode. The power dissipation is about 8mW and 2mW respectively, with and without output buffer. The linearity reaches 99.2% in the typical mode. The gain is tunable from 13mV/fC to 130mV/fC and the peaking time varies from 700ns to 1.6us.

Paper Details

Date Published: 5 August 2009
PDF: 6 pages
Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851N (5 August 2009); doi: 10.1117/12.836618
Show Author Affiliations
Mingming Zhang, Peking Univ. (China)
Zhongjian Chen, Peking Univ. (China)
Yacong Zhang, Peking Univ. (China)
Wengao Lu, Peking Univ. (China)
Huiyao An, Peking Univ. (China)
Lijiu Ji, Peking Univ. (China)


Published in SPIE Proceedings Vol. 7385:
International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications
X.-C. Zhang; James M. Ryan; Cun-lin Zhang; Chuan-xiang Tang, Editor(s)

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