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Proceedings Paper

Determination of zero incident angle by optical feedback effect and its applications in the measurement of refractive indices
Author(s): Xiao-Kang Zhang; Run-Hua Li
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Paper Abstract

Prisms are involved in many instruments of measurements of refractive indices. The optical feedback effect in a semiconductor laser introduced by the reflection of a prism was applied to the determination of zero incident angle. Without any additional optical components or calibration setups the angular resolution reached 0.00074°. This approach was used in refractometers and prism coupling system. Prisms, water, wintergreen oil and a quartz plate were measured by total internal reflection technique and the optical feedback effect. In the measurement of prism, we proposed that the base angle of a detected prism should be appropriately prepared so as that the refractive index of an isosceles prism made of any material can be precisely measured. The results for a SrTiO3 prism with a base angle 30.0169 degree was 2.3780 at 659 nm. The measurements of water and wintergreen oil were performed by a reference prism made of SrTiO3. We found that the result for a quartz plate wouldn't be influenced by the index matching liquid between the plate and a reference prism, which was intentionally introduced, only if the index of the liquid was larger than that of the quartz. The refractive index of a polymer film was measured accurately and the maximum of deviation from mean was ±0.0001.

Paper Details

Date Published: 30 November 2009
PDF: 11 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750620 (30 November 2009); doi: 10.1117/12.836599
Show Author Affiliations
Xiao-Kang Zhang, South China Univ. of Technology (China)
Run-Hua Li, South China Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)

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