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Proceedings Paper

Numerical analysis of laser-induced damage threshold search algorithms and their uncertainty
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Paper Abstract

Determination of absolute Laser-Induced Damage Threshold (LIDT) value from experimentally obtained statistical data is still very important metrological problem in terms of accuracy and repeatability. In fact experimentally estimated LIDTs are always affected by many factors such as (temporal, energy, pointing and beam shape) stability of laser pulses used for damage testing as well as properties (homogeneity and limited size) of the sample to be tested. These problems are especially important in case of small aperture limited samples when testing with nanosecond pulses where the mechanism of damage is usually driven by defects. Several known experimental techniques or its modifications (for example raster scan) are typically applied for LIDT estimation in 1-on-1 mode namely Damage Frequency Method (DFM) and General Binary Search Technique (GBST). Almost all methods lead to the same value of LIDT under ideal experimental conditions and sufficiently large number of interrogated test sites. The goal of this numerical study is to analyze the performance (accuracy and repeatability) of above mentioned algorithms with respect to damage limiting surface defect density under non-ideal experimental conditions: energetic instabilities of laser radiation and aperture limited to max. 300 sites. Herewith we also introduce "moving average" measurement concept. The conclusions are drawn about the precision of all above mentioned methods.

Paper Details

Date Published: 31 December 2009
PDF: 12 pages
Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75041D (31 December 2009); doi: 10.1117/12.836469
Show Author Affiliations
Andrius Melninkaitis, Vilnius Univ. (Lithuania)
Gintaré Bataviciute, Vilnius Univ. (Lithuania)
Valdas Sirutkaitis, Vilnius Univ. (Lithuania)


Published in SPIE Proceedings Vol. 7504:
Laser-Induced Damage in Optical Materials: 2009
Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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