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Proceedings Paper

The research of package for CdZnTe detector based on the capacitive Frisch grid structure
Author(s): Kai-feng Qin; Lin-jun Wang; Jia-hua Min; Jianyong Teng; Zhu-bin Shi; Chen-ying Zhou; Ji-jun Zhang; Jian Huang; Yiben Xia
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Paper Abstract

In this paper, the design and fabrication of a capacitive Frisch grid structure for CdZnTe (CZT) detector were investigated. The aging tests were first used to investigate the degradation of the mechanical and electrical characteristics of the CdZnTe detector based on the capacitive frisch grid structure. The effects of the degradation on the performance of CdZnTe detectors were investigated by scanning acoustic microscopy (SAM) test, current-voltage test, and multichannel pulse-height spectrum analysis. In particular, a passivation layer obtained by a two-step passivation processing, combined with a Teflon tape, was used as an insulated layer of the capacitive Frisch grid detector, improving its stability effectively at high voltages. However, further improvements in material and device fabrication (including insulated layer) were required to realize the potential of CZT detectors with the capacitive Frisch grid structure.

Paper Details

Date Published: 4 August 2009
PDF: 6 pages
Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851Q (4 August 2009); doi: 10.1117/12.836279
Show Author Affiliations
Kai-feng Qin, Shanghai Univ. (China)
Lin-jun Wang, Shanghai Univ. (China)
Jia-hua Min, Shanghai Univ. (China)
Jianyong Teng, Shanghai Univ. (China)
Zhu-bin Shi, Shanghai Univ. (China)
Chen-ying Zhou, Shanghai Univ. (China)
Ji-jun Zhang, Shanghai Univ. (China)
Jian Huang, Shanghai Univ. (China)
Yiben Xia, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 7385:
International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications
X.-C. Zhang; James M. Ryan; Cun-lin Zhang; Chuan-xiang Tang, Editor(s)

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