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Proceedings Paper

Novel system for automatic measuring diopter based on ARM circuit block
Author(s): Feng Xue; Lei Zhong; Zhe Chen; Deng-pan Xue; Xiang-ning Li
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Paper Abstract

Traditional commercial instruments utilized in vision screening programs cannot satisfy the request for real-time diopter measurement by far, and their success is limited by some defectiveness such as computer-attached, clumsy volume, and low accuracy of parameters measured, etc. In addition, astigmatic eyes cannot be determined in many devices. This paper proposes a new design of diopter measurement system based on SAMSUNG's ARM9 circuit block. There are several contributions in the design. The new developed system has not only the function of automatically measuring diopter, but also the advantages of the low cost, and especially the simplicity and portability. Besides, by placing point sources in three directions, the instrument can determine astigmatic eyes at the same time. Most of the details are introduced as the integrated design of measuring system, interface circuit of embedded system and so on. Through a preliminary experiment, it is proved that the system keeps good feasibility and validity. The maximum deviation of measurement result is 0.344D.The experimental results also demonstrate the system can provide the service needed for real-time applications. The instrument present here is expected to be widely applied in many fields such as the clinic and home healthcare.

Paper Details

Date Published: 24 August 2009
PDF: 7 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73812E (24 August 2009); doi: 10.1117/12.836003
Show Author Affiliations
Feng Xue, Univ. of Shanghai for Science and Technology (China)
Lei Zhong, Univ. of Shanghai for Science and Technology (China)
Shanghai Key Lab. of Modern Optical System (China)
Zhe Chen, Univ. of Shanghai for Science and Technology (China)
Deng-pan Xue, Univ. of Shanghai for Science and Technology (China)
Xiang-ning Li, Univ. of Shanghai for Science and Technology (China)
Shanghai Key Lab. of Modern Optical System (China)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

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