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Proceedings Paper

The (1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 nanograde film produced by improved LPE method
Author(s): Youbao Wan; Yurong Wu; Jianxing Zhang; Peizhi Yang; Lingrong Xiao; Guoxiang Yuan; Hui Yan
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Paper Abstract

(1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 nano-grade films were produced by using both an normally liquid phase epitaxy and an improved vertically dipping liquid phase epitaxy system developed by ourselves. Utilizing a specially heating device, the improved liquid phase epitaxy system can offer a controllable time-lag before the melt adhered on the bottom of the substrate crystallized into film. In the time-lag moment, the force of the rolling substrate driven by the rolling seed role would throw out some melt adhered on the bottom of the substrate and reduce the quantity of the melt. And the surface of the film can be smoothed. By adjusting the quality of the melt left on the bottom of the substrate, nanograde thin films of (1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 were grown up on the substrates of SrTiO3 (001). The morphology of the both films produced by normal LPE method and our improved LPE method were investigated by OM. The results show that the films produced by using this improved LPE method have uniform morphology without powders adhered in it. The farther investigation of the morphology of the PZNT film produced by our improved LPE method was done by using AFM show that the grains of the films have column-shaped morphology with similar size. For the films produced by using normal LPE method, the farther investigation of their morphology were done by SEM method. The results show that there are square-shaped grains with different size for the grains of the film, and there are many stuff material in the space among the grains. The study of XRD reveals that the films produced by using both normal LPE method and improved method had good alignment on the SrTiO3 (001) substrate.

Paper Details

Date Published: 24 August 2009
PDF: 10 pages
Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 738114 (24 August 2009); doi: 10.1117/12.835571
Show Author Affiliations
Youbao Wan, Jiaxing Univ. (China)
Yunnan Normal Univ. (China)
Yurong Wu, Yunnan Normal Univ. (China)
Jianxing Zhang, Yunnan Normal Univ. (China)
Peizhi Yang, Zhejiang Univ. (China)
Lingrong Xiao, Yunnan Normal Univ. (China)
Guoxiang Yuan, Yunnan Normal Univ. (China)
Hui Yan, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7381:
International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Xu-yuan Chen; Yue-lin Wang; Zhi-ping Zhou; Qing-kang Wang, Editor(s)

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