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Proceedings Paper

Comparative research on femtosecond laser and nanosecond laser induced damage to CCD
Author(s): Jing-jing Dai; Zhi-yong Wang
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Paper Abstract

The contrastive damage experiments of CCD irradiated by 800nm femtosecond laser with the pulse duration of 330fs and 1064nm laser with the pulse duration of 10ns were studied from the energy density and power density. The failure problems of the CCD devices irradiated by the two kinds of laser pulses were studied. The experimental results show that the failure threshold of CCD irradiated by femtosecond laser is 2.3 nJ / cm2 and it is 3~4 order lower than that by nanosecond laser. According to the micro-analysis of CCD, it is found that the damage takes place at the light activated elements.

Paper Details

Date Published: 31 August 2009
PDF: 6 pages
Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73823S (31 August 2009); doi: 10.1117/12.835560
Show Author Affiliations
Jing-jing Dai, Beijing Univ. of Technology (China)
Zhi-yong Wang, Beijing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7382:
International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging
Farzin Amzajerdian; Chun-qing Gao; Tian-yu Xie, Editor(s)

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